Concepedia

Allison Taber

AT

Statistics

Publications

4

Citations

868

H-Index

4

Active since

1993

Affiliations

IBM (United States)(Current)

Rho (United States)

Allison Taber is an author at IBM (United States) specializing in device reliability, engineering, and radiation effects on reliability.

Publications per year

1993–1996

4

Publications

4

IBM experiments in soft fails in computer electronics (1978–1994)

J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld et al. · IBM Journal of Research and Development · 1996 · 453 citations

Engineering, Computer Engineering, Computer Systems +17

Single event upset in avionics

Allison Taber, E. Normand · IEEE Transactions on Nuclear Science · 1993 · 216 citations

Engineering, Aerospace Engineering, Electrical Engineering +17

Field testing for cosmic ray soft errors in semiconductor memories

T. O'Gorman, Joe Ross, Allison Taber et al. · IBM Journal of Research and Development · 1996 · 165 citations

Engineering, Computer Engineering, Electrical Engineering +16

Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics.

Allison Taber, E. Normand · 1995 · 34 citations

Engineering, Aerospace Engineering, Electrical Engineering +17

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