T. O'Gorman

IBM experiments in soft fails in computer electronics (1978–1994)

J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld et al. · IBM Journal of Research and Development · 1996 · 450 citations

Engineering, Computer Architecture, Ibm Experiments +17

Field testing for cosmic ray soft errors in semiconductor memories

T. O'Gorman, Joe Ross, Allison Taber et al. · IBM Journal of Research and Development · 1996 · 165 citations

Engineering, Memory Chips, Mem Testing +21

The effect of cosmic rays on the soft error rate of a DRAM at ground level

T. O'Gorman · IEEE Transactions on Electron Devices · 1994 · 122 citations

Engineering, Space Environment, Physics +10

Accelerated testing for cosmic soft-error rate

J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose et al. · IBM Journal of Research and Development · 1996 · 92 citations

A comparison of H-mode pedestal characteristics in MAST as a function of magnetic configuration and ELM type

A. Kirk, T. O'Gorman, S. Saarelma et al. · Plasma Physics and Controlled Fusion · 2009 · 55 citations

Magnetism, Electrical Engineering, Engineering +9