V. Pouget

Pulsed-Laser Testing for Single-Event Effects Investigations

S. Büchner, F. Miller, V. Pouget et al. · IEEE Transactions on Nuclear Science · 2013 · 162 citations

Pulsed-laser Testing, Photonics, Electrical Engineering +14

Determining Realistic Parameters for the <newline/> Double Exponential Law that Models<newline/> Transient Current Pulses

F. Wrobel, Luigi Dilillo, Antoine Touboul et al. · IEEE Transactions on Nuclear Science · 2014 · 56 citations

Device Modeling, Electrical Engineering, Single Event Upset +15

Investigation of single-event transients in voltage-controlled oscillators

Wenjian Chen, V. Pouget, Hugh Barnaby et al. · IEEE Transactions on Nuclear Science · 2003 · 56 citations

Electrical Engineering, Nonlinear Oscillation, Engineering +8

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

S. Büchner, Nicolas J.-H. Roche, Jeffrey H. Warner et al. · IEEE Transactions on Nuclear Science · 2012 · 51 citations

Engineering, Measurement, Laser-plasma Interaction +16

Influence of Laser Pulse Duration in Single Event Upset Testing

A. Douin, V. Pouget, F. Darracq et al. · IEEE Transactions on Nuclear Science · 2006 · 45 citations