P. Fouillat

Investigation of single-event transients in voltage-controlled oscillators

Wenjian Chen, V. Pouget, Hugh Barnaby et al. · IEEE Transactions on Nuclear Science · 2003 · 56 citations

Engineering, Electrical Engineering, Circuit Theory +15

Effects of beam spot size on the correlation between laser and heavy ion SEU testing

F. Miller, N. Buard, T. Carrière et al. · IEEE Transactions on Nuclear Science · 2004 · 46 citations

Natural Sciences, Nuclear Engineering, Physics +9

Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC

V. Pouget, D. Lewis, P. Fouillat · IEEE Transactions on Instrumentation and Measurement · 2004 · 46 citations

Engineering, Computer Engineering, Electrical Engineering +17

Influence of Laser Pulse Duration in Single Event Upset Testing

A. Douin, V. Pouget, F. Darracq et al. · IEEE Transactions on Nuclear Science · 2006 · 45 citations

Engineering, Electrical Engineering, Physics +15

Investigation of millisecond-long analog single-event transients in the LM6144 op amp

Y. Boulghassoul, S. Büchner, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2004 · 32 citations

Engineering, Electrical Engineering, Microelectronics +15