A. Douin

Influence of Laser Pulse Duration in Single Event Upset Testing

A. Douin, V. Pouget, F. Darracq et al. · IEEE Transactions on Nuclear Science · 2006 · 45 citations

Engineering, Electrical Engineering, Physics +15

TOOLS AND METHODOLOGY DEVELOPMENT FOR PULSED LASER FAULT INJECTION IN SRAM-BASED FPGAS

V. Pouget, A. Douin, D. Lewis et al. · 2008 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +17

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection

V. Pouget, A. Douin, G. Foucard et al. · 2008 · 15 citations

Engineering, Computer Engineering, Computer Science +17

Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results

V. Maingot, J. Ferron, R. Leveugle et al. · Microelectronics Reliability · 2007 · 13 citations

Engineering, Computer Engineering, Computer Science +17

Laser Validation of a Non-Destructive Test Methodology for the Radiation Sensitivity Assessment of Power Devices

F. Miller, S. Morand, A. Douin et al. · IEEE Transactions on Nuclear Science · 2011 · 11 citations

Engineering, Electrical Engineering, Microelectronics +16