D. Lewis

Backside laser testing of ICs for SET sensitivity evaluation

D. Lewis, V. Pouget, F. Beaudoin et al. · IEEE Transactions on Nuclear Science · 2001 · 85 citations

Engineering, Computer Engineering, Electrical Engineering +13

Theoretical Investigation of an Equivalent Laser LET

V. Pouget, H. Lapuyade, P. Fouillat et al. · Microelectronics Reliability · 2001 · 71 citations

Natural Sciences, Physics, Optics +9

Laser beam thermography of circuits in the particular case of passivated semiconductors

Véronique Quintard, Gerald Deboy, S. Dilhaire et al. · Microelectronic Engineering · 1996 · 62 citations

Engineering, Materials Engineering, Materials Science +16

Investigation of single-event transients in voltage-controlled oscillators

Wenjian Chen, V. Pouget, Hugh Barnaby et al. · IEEE Transactions on Nuclear Science · 2003 · 56 citations

Engineering, Electrical Engineering, Circuit Theory +15

Time-Resolved Scanning of Integrated Circuits With a Pulsed Laser: Application to Transient Fault Injection in an ADC

V. Pouget, D. Lewis, P. Fouillat · IEEE Transactions on Instrumentation and Measurement · 2004 · 46 citations

Engineering, Computer Engineering, Electrical Engineering +17