Laser beam thermography of circuits in the particular case of passivated semiconductors

Optical absorption of silicon between 1.6 and 4.7 eV at elevated temperatures

G. E. Jellison, F. A. Modine · Applied Physics Letters · 1982 · 292 citations

Engineering, Materials Engineering, Materials Science +17

Design and operation of an automated, high-temperature ellipsometer

Y. J. van der Meulen, N. C. Hien · Journal of the Optical Society of America · 1974 · 86 citations

Natural Sciences, Materials Engineering, Materials Science +17

Thermoreflectance optical test probe for the measurement of current‐induced temperature changes in microelectronic components

W. Claeys, S. Dilhaire, Véronique Quintard et al. · Quality and Reliability Engineering International · 1993 · 41 citations

Engineering, Electrical Engineering, Materials Science +17

Nonintrusive wafer temperature measurement using <i>in</i> <i>situ</i> ellipsometry

G. M. W. Kroesen, G. S. Oehrlein, T. D. Bestwick · Journal of Applied Physics · 1991 · 39 citations · Full text

Natural Sciences, Materials Science, Physics +17

Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing

W. Claeys, S. Dilhaire, Véronique Quintard · Microelectronic Engineering · 1994 · 37 citations

Engineering, Electrical Engineering, Materials Science +17