Publication | Closed Access
Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing
37
Citations
4
References
1994
Year
Electrical EngineeringEngineeringHardware ReliabilityOptical PropertiesThermal BehaviourDevice ReliabilityApplied PhysicsLaser ProbingLaser-induced BreakdownElectronic ComponentsThermal AnalysisElectronic PackagingHeat TransferInstrumentationThermal EngineeringOptoelectronicsPhysic Of FailureLaser Damage
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|---|---|---|
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