W. Claeys

Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions

S. Dilhaire, Stéphane Grauby, W. Claeys · Applied Physics Letters · 2004 · 69 citations · Full text

Engineering, Measurement, Optical Testing +23

Laser beam thermography of circuits in the particular case of passivated semiconductors

Véronique Quintard, Gerald Deboy, S. Dilhaire et al. · Microelectronic Engineering · 1996 · 62 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +12

Thermoreflectance optical test probe for the measurement of current‐induced temperature changes in microelectronic components

W. Claeys, S. Dilhaire, Véronique Quintard et al. · Quality and Reliability Engineering International · 1993 · 41 citations

Optical Materials, Engineering, Measurement +26

Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing

W. Claeys, S. Dilhaire, Véronique Quintard · Microelectronic Engineering · 1994 · 37 citations

Electrical Engineering, Engineering, Hardware Reliability +15

Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices

Stéphane Grauby, S. Dilhaire, S. Jorez et al. · Review of Scientific Instruments · 2003 · 27 citations

Engineering, Microscopy, Transient Imaging +23