S. Jorez

Thin films stress extraction using micromachined structures and wafer curvature measurements

J. Laconte, F. Iker, S. Jorez et al. · Microelectronic Engineering · 2004 · 86 citations

Engineering, Materials Engineering, Materials Science +14

Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices

Stéphane Grauby, S. Dilhaire, S. Jorez et al. · Review of Scientific Instruments · 2003 · 27 citations

Engineering, Electrical Engineering, Mechanical Engineering +17

Optical method for the measurement of the thermomechanical behaviour of electronic devices

S. Dilhaire, S. Jorez, A. Cornet et al. · Microelectronics Reliability · 1999 · 26 citations

Natural Sciences, Materials Science, Physics +16

Laser probes for the thermal and thermomechanical characterisation of microelectronic devices

Wilfrid Claeys, S. Dilhaire, S. Jorez et al. · Microelectronics Journal · 2001 · 24 citations

Engineering, Electrical Engineering, Mechanical Engineering +17

Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging

Stéphane Grauby, S. Dilhaire, S. Jorez et al. · IEEE Electron Device Letters · 2005 · 22 citations

Engineering, Electrical Engineering, Mechanical Engineering +17