S. Jorez

Thin films stress extraction using micromachined structures and wafer curvature measurements

J. Laconte, F. Iker, S. Jorez et al. · Microelectronic Engineering · 2004 · 84 citations

Materials Science, Wafer Scale Processing, Engineering +12

Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices

Stéphane Grauby, S. Dilhaire, S. Jorez et al. · Review of Scientific Instruments · 2003 · 27 citations

Engineering, Microscopy, Transient Imaging +23

Optical method for the measurement of the thermomechanical behaviour of electronic devices

S. Dilhaire, S. Jorez, A. Cornet et al. · Microelectronics Reliability · 1999 · 26 citations

Optical Materials, Electronic Devices, Engineering +15

Laser probes for the thermal and thermomechanical characterisation of microelectronic devices

Wilfrid Claeys, S. Dilhaire, S. Jorez et al. · Microelectronics Journal · 2001 · 24 citations

Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging

Stéphane Grauby, S. Dilhaire, S. Jorez et al. · IEEE Electron Device Letters · 2005 · 22 citations

Engineering, Differential Scanning Calorimetry, Microscopy +19