F. Iker

Thin films stress extraction using micromachined structures and wafer curvature measurements

J. Laconte, F. Iker, S. Jorez et al. · Microelectronic Engineering · 2004 · 86 citations

Engineering, Materials Engineering, Materials Science +14

Design and implementation of flexible and stretchable systems

Mario González, Bart Vandevelde, Wim Christiaens et al. · Microelectronics Reliability · 2011 · 38 citations

Engineering, Design, Systems Engineering +12

Steady-state measurement of wafer bonding cracking resistance

Yannick Bertholet, F. Iker, Jean‐Pierre Raskin et al. · Sensors and Actuators A Physical · 2003 · 37 citations · Full text

Engineering, Materials Engineering, Materials Science +12

3D Embedding and Interconnection of Ultra Thin (≪ 20 μm) Silicon Dies

F. Iker, Deniz Sabuncuoglu Tezcan, Ricardo Cotrin Teixeira et al. · 2007 · 19 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Bulk and surface micromachined MEMS in thin film SOI technology

Jean‐Pierre Raskin, F. Iker, Nicolás André et al. · Electrochimica Acta · 2006 · 18 citations

Engineering, Materials Science, Mechanical Engineering +12