Jean‐Pierre Raskin

Raman and XPS characterization of vanadium oxide thin films with temperature

Ferran Ureña-Begara, Aurélian Crunteanu, Jean‐Pierre Raskin · Applied Surface Science · 2017 · 339 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +12

Substrate crosstalk reduction using SOI technology

Jean‐Pierre Raskin, A. Viviani, Denis Flandre et al. · IEEE Transactions on Electron Devices · 1997 · 292 citations

Engineering, Electrical Engineering, Microelectronics +15

Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling

Jean‐Pierre Raskin, Renaud Gillon, Jian Chen et al. · IEEE Transactions on Electron Devices · 1998 · 137 citations

Engineering, Electrical Engineering, Microelectronics +16

New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity

Dimitri Lederer, Jean‐Pierre Raskin · IEEE Electron Device Letters · 2005 · 134 citations

Engineering, Electrical Engineering, Materials Science +17

Effective resistivity of fully-processed SOI substrates

Dimitri Lederer, Jean‐Pierre Raskin · Solid-State Electronics · 2005 · 131 citations

Engineering, Electrical Engineering, Materials Science +12