Jean‐Pierre Raskin

Raman and XPS characterization of vanadium oxide thin films with temperature

Ferran Ureña-Begara, Aurélian Crunteanu, Jean‐Pierre Raskin · Applied Surface Science · 2017 · 322 citations · Full text

Materials Science, Material Analysis, Engineering +6

Substrate crosstalk reduction using SOI technology

Jean‐Pierre Raskin, A. Viviani, Denis Flandre et al. · IEEE Transactions on Electron Devices · 1997 · 290 citations

Electrical Engineering, Engineering, Advanced Packaging (Semiconductors) +15

Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling

Jean‐Pierre Raskin, Renaud Gillon, Jian Chen et al. · IEEE Transactions on Electron Devices · 1998 · 137 citations

Device Modeling, Electrical Engineering, Calibration Structures +15

New substrate passivation method dedicated to HR SOI wafer fabrication with increased substrate resistivity

Dimitri Lederer, Jean‐Pierre Raskin · IEEE Electron Device Letters · 2005 · 132 citations

Engineering, Silicon On Insulator, Semiconductor Device +16

Effective resistivity of fully-processed SOI substrates

Dimitri Lederer, Jean‐Pierre Raskin · Solid-State Electronics · 2005 · 129 citations

Materials Science, Engineering, Surface Science +6