Raman and XPS characterization of vanadium oxide thin films with temperature

Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Cr, Mn, Fe, Co and Ni

Mark C. Biesinger, Brad P. Payne, Andrew P. Grosvenor et al. · Applied Surface Science · 2010 · 10.2K citations

Materials Science, Inorganic Chemistry, Engineering +8

Resolving surface chemical states in XPS analysis of first row transition metals, oxides and hydroxides: Sc, Ti, V, Cu and Zn

Mark C. Biesinger, Leo Lau, Andrea R. Gerson et al. · Applied Surface Science · 2010 · 4.2K citations

Materials Science, Inorganic Chemistry, Surface Characterization +9

Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysis

C. D. Wagner, Lawrence E. Davis, M. Zeller et al. · Surface and Interface Analysis · 1981 · 2K citations

Engineering, Sensitivity Factors, Chemical Analysis +18

Determination of the V2p XPS binding energies for different vanadium oxidation states (V5+ to V0+)

Geert Silversmit, Diederik Depla, Hilde Poelman et al. · Journal of Electron Spectroscopy and Related Phenomena · 2004 · 1.8K citations

Materials Science, Inorganic Chemistry, V2p Xps +8

Mott Transition in VO ₂ Revealed by Infrared Spectroscopy and Nano-Imaging

M. M. Qazilbash, M. Brehm, Byung Gyu Chae et al. · Science · 2007 · 1.5K citations · Full text

Engineering, Strongly Correlated Electron Systems, Electronic Properties +17