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Optical absorption of silicon between 1.6 and 4.7 eV at elevated temperatures
292
Citations
12
References
1982
Year
Optical MaterialsEngineeringOptical AbsorptionOptoelectronic DevicesSilicon On InsulatorThermal RadiationElectronic DevicesOptical Absorption CoefficientOptical PropertiesPhotonicsPhotoluminescencePhysicsPhotonic MaterialsRadiative AbsorptionThermal PhysicsPhotonic DevicePolarization Modulation EllipsometryAbsorption Coefficient IncreasesElevated TemperaturesApplied PhysicsLight AbsorptionOptoelectronics
The optical absorption coefficient of silicon for photon energies between 1.65 and 4.77 eV (750– 260 nm) has been determined at elevated temperatures (up to 700 °C) using polarization modulation ellipsometry. For photon energies below ∼3 eV (∼410 nm), the absorption coefficient increases exponentially with temperature from room 24° C to 700 °C, increasing by a factor of approximately 5 over that temperature range. The threshold for direct band-gap absorption moves to lower energies with increasing temperature.
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