G. E. Jellison

Optical functions of silicon determined by two-channel polarization modulation ellipsometry

G. E. Jellison · Optical Materials · 1992 · 332 citations

Photonics, Optical Materials, Engineering +9

Data analysis for spectroscopic ellipsometry

G. E. Jellison · Thin Solid Films · 1993 · 331 citations

Data Analysis, Spectroscopy, Instrumentation +2

Optical absorption of silicon between 1.6 and 4.7 eV at elevated temperatures

G. E. Jellison, F. A. Modine · Applied Physics Letters · 1982 · 292 citations

Optical Materials, Engineering, Optical Absorption +19

Spectroscopic ellipsometry of thin film and bulk anatase (TiO2)

G. E. Jellison, L. A. Boatner, J. D. Budai et al. · Journal of Applied Physics · 2003 · 255 citations

Optical Materials, Engineering, Bulk Anatase +17

Optical functions of chemical vapor deposited thin-film silicon determined by spectroscopic ellipsometry

G. E. Jellison, M. F. Chisholm, S. M. Gorbatkin · Applied Physics Letters · 1993 · 246 citations

Optical Materials, Engineering, Ellipsometry Data +19