Y. Boulghassoul

Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM

Riaz Naseer, Y. Boulghassoul, Jeff Draper et al. · 2007 · 121 citations

Device Modeling, Electrical Engineering, Engineering +13

Three-dimensional mapping of single-event effects using two photon absorption

Dale McMorrow, William T. Lotshaw, Joseph S. Melinger et al. · IEEE Transactions on Nuclear Science · 2003 · 119 citations

Photonics, Electrical Engineering, Carrier Generation +15

Models and Algorithmic Limits for an ECC-Based Approach to Hardening Sub-100-nm SRAMs

Michael Bajura, Y. Boulghassoul, Riaz Naseer et al. · IEEE Transactions on Nuclear Science · 2007 · 112 citations

Non-volatile Memory, Engineering, Vlsi Design +21

A Hardened-by-Design Technique for RF Digital Phase-Locked Loops

T. D. Loveless, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2006 · 104 citations

Electrical Engineering, Digital Phase-locked Loops, Engineering +15

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

R.L. Pease, Andrew L. Sternberg, Y. Boulghassoul et al. · IEEE Transactions on Nuclear Science · 2002 · 82 citations

Engineering, Ion Microbeam, Laser-plasma Interaction +16