Michael Bajura

Models and Algorithmic Limits for an ECC-Based Approach to Hardening Sub-100-nm SRAMs

Michael Bajura, Y. Boulghassoul, Riaz Naseer et al. · IEEE Transactions on Nuclear Science · 2007 · 112 citations

Non-volatile Memory, Engineering, Vlsi Design +21

Split-fabrication obfuscation: Metrics and techniques

Meenatchi Jagasivamani, Peter Gadfort, Michel Sika et al. · 2014 · 71 citations

Cross-Layer Modeling and Simulation of Circuit Reliability

Yu Cao, Jyothi Velamala, Ketul B. Sutaria et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014 · 60 citations

Engineering, Computer Architecture, System Reliability +18

Imaging Integrated Circuits with X-ray Microscopy

Michael Bajura, Gregory Boverman, John Tan et al. · 2011 · 22 citations

Electrical Engineering, Engineering, Electron Microscopy +13

Modeling Radiation-Induced Degradation in Top-Gated Epitaxial Graphene Field-Effect-Transistors (FETs)

Ivan Sanchez Esqueda, Cory D. Cress, Travis J. Anderson et al. · Electronics · 2013 · 14 citations · Full text

Device Modeling, Electrical Engineering, Effective Vertical Field +13