R.L. Pease - Concepedia

Author

R.L. Pease

United States Naval Research Laboratory

Also Known As

D Fleetwood, D Osinowo, Pease, R. L., R Pease, R. L. Pease, R. Pease, R.L. Pease, Ron Pease

Publications

Citations

H-Index

Concepts

All Affiliations

United States Naval Research Laboratory Vanderbilt University Naval Sea Systems Command Seabrook Schiller International University

About

R.L. Pease is an author at United States Naval Research Laboratory specializing in electrical engineering, engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	16	922
2	Medicine	3	3	129
3	Natural Sciences	2	2	104
4	Education	1	1	50
5	Health Sciences	1	1	20

R.L. Pease

Publications

987

Citations

H-Index

Page 1

	Year	Citations
Subbandgap laser-induced single event effects: carrier generation via two-photon absorption Dale McMorrow, William T. Lotshaw, Joseph S. Melinger, IEEE Transactions on Nuclear Science Optical PumpingPhotonicsElectrical EngineeringQuantum PhotonicsCarrier Generation	2002	250
Three-dimensional mapping of single-event effects using two photon absorption Dale McMorrow, William T. Lotshaw, Joseph S. Melinger, IEEE Transactions on Nuclear Science PhotonicsElectrical EngineeringCarrier GenerationTransistor Level ModelingEngineering	2003	119
Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation R.L. Pease, Andrew L. Sternberg, Y. Boulghassoul, IEEE Transactions on Nuclear Science EngineeringIon MicrobeamLaser-plasma InteractionBipolar Linear CircuitsIon Beam	2002	82
ACCELERATED TESTS FOR SIMULATING LOW DOSE RATE GAIN DEGRADATION OF LATERAL AND SUBSTRATE PNP BIPOLAR JUNCTION TRANSISTORS S.C. Witczak, Ronald D. Schrimpf, K.F. Galloway, IEEE Transactions on Nuclear Science EngineeringRadiation EffectRadiation ExposureSemiconductor DeviceElectronic Engineering	1996	67
Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions S. Büchner, Dale McMorrow, C. Poivey, IEEE Transactions on Nuclear Science EngineeringLaser-plasma InteractionHigh-power LasersIon BeamElectrical Engineering	2004	55
Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis Y. Boulghassoul, L. W. Massengill, Andrew L. Sternberg, IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringCircuit SystemTransistor-level Circuit ModelCalibration	2002	51
The role of parasitic elements in the single-event transient response of linear circuits Andrew L. Sternberg, L. W. Massengill, S. Büchner, IEEE Transactions on Nuclear Science Device ModelingElectrical EngineeringPhysical Design (Electronics)EngineeringCircuit Design	2002	50
Pulsed-laser testing methodology for single event transients in linear devices S. Büchner, J.W. Howard, C. Poivey, IEEE Transactions on Nuclear Science EngineeringLaser ScienceMeasurementLaser-plasma InteractionEducation	2004	50
Critical charge for single-event transients (SETs) in bipolar linear circuits R.L. Pease, Andrew L. Sternberg, L. W. Massengill, IEEE Transactions on Nuclear Science EngineeringCritical ChargeIon ProcessHeavy Ion PhysicBipolar Linear Circuits	2001	49
Effect of amplifier parameters on single-event transients in an inverting operational amplifier Andrew L. Sternberg, L. W. Massengill, Ronald D. Schrimpf, IEEE Transactions on Nuclear Science Inverting Operational AmplifierElectrical EngineeringLaser DataAmplifier ParametersSingle-event Transients	2002	45

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