C. Poivey

Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis

Melanie D. Berg, C. Poivey, David Petrick et al. · IEEE Transactions on Nuclear Science · 2008 · 137 citations

Hardware Security, Electrical Engineering, Engineering +12

From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

R. Harboe-Sørensen, C. Poivey, F.-X. Guerre et al. · IEEE Transactions on Nuclear Science · 2008 · 89 citations

Engineering, Measurement, Measurement Standards (Educational Assessment) +29

Current single event effects and radiation damage results for candidate spacecraft electronics

Martha V. O'Bryan, Kenneth A. LaBel, Ray Ladbury et al. · 2003 · 58 citations

Electrical Engineering, Total Ionizing Dose, Engineering +14

Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions

S. Büchner, Dale McMorrow, C. Poivey et al. · IEEE Transactions on Nuclear Science · 2004 · 55 citations

Engineering, Laser-plasma Interaction, High-power Lasers +16

The Technology Demonstration Module On-Board PROBA-II

R. Harboe-Sørensen, C. Poivey, N. Fleurinck et al. · IEEE Transactions on Nuclear Science · 2011 · 52 citations

Engineering, Software Engineering, Orbit Determination +17