Martha V. O'Bryan

Current single event effects and radiation damage results for candidate spacecraft electronics

Martha V. O'Bryan, Kenneth A. LaBel, Ray Ladbury et al. · 2003 · 58 citations

Electrical Engineering, Total Ionizing Dose, Engineering +14

Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Martha V. O'Bryan, C. Poivey, S. Büchner et al. · 2007 · 50 citations

Electrical Engineering, Engineering, Aerospace Engineering +13

Laser-Induced Latchup Screening and Mitigation in CMOS Devices

Dale McMorrow, S. Büchner, M.P. Baze et al. · IEEE Transactions on Nuclear Science · 2006 · 42 citations

Photonics, Laser Approach, Engineering +8

A compendium of recent optocoupler radiation test data

Kenneth A. LaBel, S.D. Kniffin, Robert A. Reed et al. · 2002 · 39 citations · Full text

Radiation Testing, Single Event Transients, Total Ionizing Dose +14

Recent radiation damage and single event effect results for candidate spacecraft electronics

Martha V. O'Bryan, K.A. LaBel, Robert A. Reed et al. · 2002 · 37 citations

Electrical Engineering, Heavy Ion Physic, Recent Radiation Damage +14