K.A. LaBel

Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis

Melanie D. Berg, C. Poivey, David Petrick et al. · IEEE Transactions on Nuclear Science · 2008 · 137 citations

Hardware Security, Electrical Engineering, Engineering +12

Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation

Robert A. Reed, Paul W. Marshall, A.H. Johnston et al. · IEEE Transactions on Nuclear Science · 1998 · 59 citations

Photonics, Electrical Engineering, Permanent Radiation Degradation +14

Energy dependence of proton damage in AlGaAs light-emitting diodes

Robert A. Reed, Paul W. Marshall, Cheryl J. Marshall et al. · IEEE Transactions on Nuclear Science · 2000 · 55 citations

Wide-bandgap Semiconductor, Electrical Engineering, Solid-state Lighting +14

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Alan D. Tipton, Jonathan A. Pellish, John M. Hutson et al. · IEEE Transactions on Nuclear Science · 2008 · 53 citations

Recent radiation damage and single event effect results for candidate spacecraft electronics

Martha V. O'Bryan, K.A. LaBel, Robert A. Reed et al. · 2002 · 37 citations

Electrical Engineering, Heavy Ion Physic, Recent Radiation Damage +14