Cheryl J. Marshall

Review of displacement damage effects in silicon devices

J. R. Srour, Cheryl J. Marshall, Paul W. Marshall · IEEE Transactions on Nuclear Science · 2003 · 735 citations

Electrical Engineering, Damage Mechanism, Engineering +15

Heavy ion and proton-induced single event multiple upset

Robert A. Reed, Martin A. Carts, Paul W. Marshall et al. · IEEE Transactions on Nuclear Science · 1997 · 103 citations

Engineering, Nuclear Physics, Logic States +18

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 99 citations

Engineering, Vlsi Design, Mem Testing +17

Detectors for the<i>James Webb Space Telescope</i>Near‐Infrared Spectrograph. I. Readout Mode, Noise Model, and Calibration Considerations

Bernard J. Rauscher, Ori D. Fox, Pierre Ferruit et al. · Publications of the Astronomical Society of the Pacific · 2007 · 78 citations · Full text

Radiation effects on photonic imagers-a historical perspective

J.C. Pickel, A. H. Kalma, G.R. Hopkinson et al. · IEEE Transactions on Nuclear Science · 2003 · 76 citations

Engineering, Image Sensor, Space Radiation Environment +16