J.C. Pickel

Rate prediction for single event effects-a critique

E.L. Petersen, J.C. Pickel, James H. Adams et al. · IEEE Transactions on Nuclear Science · 1992 · 277 citations

Single Event Upset, Engineering, Rare Event Estimation +17

Cosmic Ray Induced in MOS Memory Cells

J.C. Pickel, J. T. Blandford · IEEE Transactions on Nuclear Science · 1978 · 175 citations

Non-volatile Memory, Engineering, Computer Architecture +16

Cosmic-Ray-Induced Errors in MOS Devices

J.C. Pickel, J. T. Blandford · IEEE Transactions on Nuclear Science · 1980 · 145 citations

Device Modeling, Cosmic-ray-induced Errors, Electrical Engineering +15

Geometrical factors in SEE rate calculations

E.L. Petersen, J.C. Pickel, Edward C. Smith et al. · IEEE Transactions on Nuclear Science · 1993 · 115 citations · Full text

Upset Rate Predictions., Engineering, Nuclear Physics +16

Single-event effects rate prediction

J.C. Pickel · IEEE Transactions on Nuclear Science · 1996 · 99 citations

Engineering, Space Environment, Data Science +15