J.C. Pickel

Rate prediction for single event effects-a critique

E.L. Petersen, J.C. Pickel, James H. Adams et al. · IEEE Transactions on Nuclear Science · 1992 · 279 citations

Engineering, Electrical Engineering, Circuit Theory +12

Cosmic Ray Induced in MOS Memory Cells

J.C. Pickel, J. T. Blandford · IEEE Transactions on Nuclear Science · 1978 · 176 citations

Engineering, Computer Engineering, Electrical Engineering +15

Cosmic-Ray-Induced Errors in MOS Devices

J.C. Pickel, J. T. Blandford · IEEE Transactions on Nuclear Science · 1980 · 147 citations

Engineering, Computer Engineering, Electrical Engineering +17

Geometrical factors in SEE rate calculations

E.L. Petersen, J.C. Pickel, Edward C. Smith et al. · IEEE Transactions on Nuclear Science · 1993 · 115 citations · Full text

Engineering, Electrical Engineering, Physics +10

Single-event effects rate prediction

J.C. Pickel · IEEE Transactions on Nuclear Science · 1996 · 101 citations

Engineering, Electrical Engineering, Physics +16