J.C. Pickel - Concepedia

Author

J.C. Pickel

Rockwell Automation (United States)

Also Known As

J Pickel, J. C. Pickel, J. Pickel, J.C. Pickel, James C. Pickel

Publications

1.5K

Citations

H-Index

Concepts

All Affiliations

Rockwell Automation (United States)Goddard Space Flight Center Stinger Ghaffarian Technologies (United States)The Aerospace Corporation Science Applications International Corporation (United States)

About

J.C. Pickel is an author at Rockwell Automation (United States) specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	23	1.4K
2	Health Sciences	4	4	123
3	Arts	1	1	28
4	Education	1	1	28
5	Management	1	1	99

J.C. Pickel

Publications

1.4K

Citations

H-Index

Page 1

	Year	Citations
Rate prediction for single event effects-a critique E.L. Petersen, J.C. Pickel, James H. Adams, IEEE Transactions on Nuclear Science Single Event UpsetEngineeringRare Event EstimationEvent CorrelationIon Beam Instrumentation	1992	277
Cosmic Ray Induced in MOS Memory Cells J.C. Pickel, J. T. Blandford IEEE Transactions on Nuclear Science Non-volatile MemoryEngineeringComputer ArchitectureHardware SecurityBit Error Rate	1978	175
Cosmic-Ray-Induced Errors in MOS Devices J.C. Pickel, J. T. Blandford IEEE Transactions on Nuclear Science Device ModelingCosmic-ray-induced ErrorsElectrical EngineeringError Rate ModelEngineering	1980	145
Geometrical factors in SEE rate calculations E.L. Petersen, J.C. Pickel, Edward C. Smith, IEEE Transactions on Nuclear Science Upset Rate Predictions.EngineeringNuclear PhysicsGeometryMeasurement	1993	115
Single-event effects rate prediction J.C. Pickel IEEE Transactions on Nuclear Science EngineeringSpace EnvironmentData ScienceUncertainty QuantificationModel Parameter Choices	1996	99
Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future Robert A. Reed, J.D. Kinnison, J.C. Pickel, IEEE Transactions on Nuclear Science EngineeringSpace EnvironmentSpace SystemEarth ScienceElectromagnetic Compatibility	2003	80
Radiation effects on photonic imagers-a historical perspective J.C. Pickel, A. H. Kalma, G.R. Hopkinson, IEEE Transactions on Nuclear Science EngineeringImage SensorSpace Radiation EnvironmentInfrared OpticInstrumentation	2003	76
Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits Robert A. Reed, Paul W. Marshall, J.C. Pickel, IEEE Transactions on Nuclear Science EngineeringVlsi DesignSingle-event UpsetsSemiconductor DeviceHeavy-ion Broad-beam	2003	69
CMOS RAM Cosmic-Ray-Induced-Error-Rate Analysis J.C. Pickel, J. T. Blandford IEEE Transactions on Nuclear Science EngineeringHardware ReliabilityBit-error RateBias Temperature InstabilityComputer Engineering	1981	51
Effect of CMOS Miniaturization on Cosmic-Ray-Induced Error Rate J.C. Pickel IEEE Transactions on Nuclear Science EngineeringVlsi DesignDetailed ComputerSpace EnvironmentComputer Architecture	1982	42

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