Single-event effects rate prediction

Abstract

Common practices for predicting rates of single-event effects (SEE) in microelectronics in space environments are reviewed. Established rate-prediction models are discussed, and comparison is drawn between alternative approaches with discussion of dominant modeling parameters, assumptions, and limitations and the impact on prediction results. Areas of current uncertainty are identified. Approaches for obtaining model parameters from test data are reviewed. The methods are illustrated by example calculations that explore the sensitivity of results on model parameter choices.