Martin A. Carts

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

Paul W. Marshall, Martin A. Carts, A.B. Campbell et al. · IEEE Transactions on Nuclear Science · 2000 · 108 citations

Engineering, Vlsi Design, Computer Architecture +16

Heavy ion and proton-induced single event multiple upset

Robert A. Reed, Martin A. Carts, Paul W. Marshall et al. · IEEE Transactions on Nuclear Science · 1997 · 103 citations

Engineering, Nuclear Physics, Logic States +18

Particle-induced bit errors in high performance fiber optic data links for satellite data management

Paul W. Marshall, C.J. Dale, Martin A. Carts et al. · IEEE Transactions on Nuclear Science · 1994 · 102 citations

Engineering, Optical Transmission System, Fiber Optics +18

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 99 citations

Engineering, Vlsi Design, Mem Testing +17

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Robert A. Reed, Paul W. Marshall, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 69 citations

Engineering, Vlsi Design, Single-event Upsets +17