A.B. Campbell

Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

Joseph S. Melinger, S. Büchner, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 1994 · 260 citations · Full text

Natural Sciences, Materials Science, Physics +14

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

Paul W. Marshall, Martin A. Carts, A.B. Campbell et al. · IEEE Transactions on Nuclear Science · 2000 · 108 citations

Engineering, Computer Engineering, Electrical Engineering +17

Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices

V. Ferlet-Cavrois, Philippe Paillet, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2005 · 95 citations

Engineering, Electrical Engineering, Microelectronics +16

Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth

Joseph S. Melinger, Dale McMorrow, A.B. Campbell et al. · Journal of Applied Physics · 1998 · 85 citations

Engineering, Electrical Engineering, Physics +15

Charge collection in silicon for ions of different energy but same linear energy transfer (LET)

W.J. Stapor, P.T. McDonald, A.R. Knudson et al. · IEEE Transactions on Nuclear Science · 1988 · 83 citations

Natural Sciences, Materials Science, Physics +14