Philippe Paillet

Radiation Effects in MOS Oxides

James R. Schwank, M.R. Shaneyfelt, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science · 2008 · 935 citations

Engineering, Electrical Engineering, Materials Science +17

Radiation effects in SOI technologies

J.R. Schwank, V. Ferlet-Cavrois, M.R. Shaneyfelt et al. · IEEE Transactions on Nuclear Science · 2003 · 434 citations

Engineering, Computer Engineering, Electrical Engineering +17

Overview of radiation induced point defects in silica-based optical fibers

Sylvain Girard, A. Alessi, N. Richard et al. · Reviews in Physics · 2019 · 341 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

V. Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin et al. · IEEE Transactions on Nuclear Science · 2006 · 153 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

V. Ferlet-Cavrois, Philippe Paillet, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2007 · 152 citations

Engineering, Electrical Engineering, Microelectronics +14