V. Ferlet-Cavrois

Radiation effects in SOI technologies

J.R. Schwank, V. Ferlet-Cavrois, M.R. Shaneyfelt et al. · IEEE Transactions on Nuclear Science · 2003 · 434 citations

Engineering, Computer Engineering, Electrical Engineering +17

Single Event Transients in Digital CMOS—A Review

V. Ferlet-Cavrois, L. W. Massengill, Pascale Gouker · IEEE Transactions on Nuclear Science · 2013 · 396 citations

Engineering, Computer Engineering, Computer Science +17

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

V. Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin et al. · IEEE Transactions on Nuclear Science · 2006 · 153 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

V. Ferlet-Cavrois, Philippe Paillet, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2007 · 152 citations

Engineering, Electrical Engineering, Microelectronics +14

Worst-case bias during total dose irradiation of SOI transistors

V. Ferlet-Cavrois, T. Colladant, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2000 · 136 citations · Full text

Engineering, Electrical Engineering, Microelectronics +15