Single Event Transients in Digital CMOS—A Review

V. Ferlet-Cavrois, L. W. Massengill, Pascale Gouker

IEEE Transactions on Nuclear Science

EngineeringComputer ArchitectureFault ToleranceHardware SecurityReliability Engineering +16

Generation and Propagation of Single Event Transients in 0.18-$\mu{\rm m}$ Fully Depleted SOI

Pascale Gouker, Jim Brandt, P.W. Wyatt, +8

IEEE Transactions on Nuclear Science

Electrical EngineeringSingle Event TransientsFast Logic CircuitsVlsi DesignPhysics +13

Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

Matthew J. Gadlage, Jonathan R. Ahlbin, Vishwanath Ramachandran, +12

IEEE Transactions on Nuclear Science

EngineeringVlsi DesignTemperature DependenceSilicon On InsulatorSemiconductor Device +18

The role of nanoclusters in reducing hole trapping in ion implanted oxides

B. J. Mrstik, H.L. Hughes, Pascale Gouker, +2

IEEE Transactions on Nuclear Science

EngineeringNanoporous MaterialNanoclusterSilicon On InsulatorNegative Shift +16

Large Scale Cryogenic Integration Approach for Superconducting High-Performance Computing

Rabindra Nath Das, Vladimir Bolkhovsky, Sergey K. Tolpygo, +4

Superconducting MaterialEngineeringVlsi DesignComputer ArchitectureIntegrated Circuits +15

Hardness Assurance Testing for Proton Direct Ionization Effects

James R. Schwank, M.R. Shaneyfelt, Véronique Ferlet-Cavrois, +14

IEEE Transactions on Nuclear Science

Electrical EngineeringEngineeringRadiation DetectionNuclear PhysicsPhysics +11

Heavy-Ion-Induced Digital Single Event Transients in a 180 nm Fully Depleted SOI Process

Matthew J. Gadlage, Pascale Gouker, B. L. Bhuva, +2

IEEE Transactions on Nuclear Science

Electrical EngineeringSoi TechnologyEngineeringVlsi DesignPhysics +12

Substrate removal and BOX thinning effects on total dose response of FDSOI NMOSFET

Pascale Gouker, J.A. Burns, P.W. Wyatt, +3

IEEE Transactions on Nuclear Science

Oxide ThinningElectrical EngineeringEngineeringRf SemiconductorPhysics +12

Radiation Effects in 3D Integrated SOI SRAM Circuits

Pascale Gouker, Brian Tyrrell, Richard D’Onofrio, +14

IEEE Transactions on Nuclear Science

EngineeringVlsi DesignIntegrated CircuitsCircuit WafersInterconnect (Integrated Circuits) +15

Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs

James R. Schwank, M.R. Shaneyfelt, P.E. Dodd, +11

IEEE Transactions on Nuclear Science

EngineeringOptical Transmission SystemLaser ApplicationsLaser AblationTwo-photon Absorption +18