Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed, +14

IEEE Transactions on Nuclear Science

Rate PredictionsLow Energy ProtonsElectrical EngineeringHeavy Ion PhysicEngineering +12

Multiple-Bit Upset in 130 nm CMOS Technology

Alan D. Tipton, Jonathan A. Pellish, Robert A. Reed, +10

IEEE Transactions on Nuclear Science

EngineeringVlsi DesignMem TestingComputer ArchitectureIntegrated Circuits +16

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

Jeffrey D. Black, Dennis R. Ball, William H. Robinson, +11

IEEE Transactions on Nuclear Science

Hardware SecurityElectrical EngineeringWell-collapse Source-injection MechanismsEngineeringNuclear Physics +11

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Alan D. Tipton, Jonathan A. Pellish, John M. Hutson, +14

IEEE Transactions on Nuclear Science

Laser-Induced Current Transients in Silicon-Germanium HBTs

Jonathan A. Pellish, Robert A. Reed, Dale McMorrow, +15

IEEE Transactions on Nuclear Science

Transient GratingPhotonicsElectrical EngineeringEngineeringPhysics +12

Increased Rate of Multiple-Bit Upset From Neutrons at Large Angles of Incidence

Alan D. Tipton, Xiao‐Wei Zhu, Haixiao Weng, +6

IEEE Transactions on Device and Materials Reliability

EngineeringNuclear PhysicsLarge AnglesHardware SecurityReliability Engineering +19

Evidence for Lateral Angle Effect on Single-Event Latchup in 65 nm SRAMs

John M. Hutson, Jonathan A. Pellish, Alan D. Tipton, +14

IEEE Transactions on Nuclear Science

Electrical EngineeringEngineeringVlsi DesignPhysicsBias Temperature Instability +12

Lithium-ion cells for aerospace applications

Shaikh Tofazzel Hossain, Alan D. Tipton, S.T. Mayer, +2

Electric BatteryElectrical EngineeringEngineeringAerospace EngineeringSolar Power +13

Applications of heavy ion microprobe for single event effects analysis

Robert A. Reed, György Vizkelethy, Jonathan A. Pellish, +10

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Electrical EngineeringHeavy Ion PhysicEngineeringPhysicsMass Spectrometry +7