Alan D. Tipton

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2009 · 191 citations

Rate Predictions, Low Energy Protons, Electrical Engineering +14

Multiple-Bit Upset in 130 nm CMOS Technology

Alan D. Tipton, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2006 · 102 citations

Engineering, Vlsi Design, Mem Testing +18

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

Jeffrey D. Black, Dennis R. Ball, William H. Robinson et al. · IEEE Transactions on Nuclear Science · 2008 · 82 citations

Hardware Security, Electrical Engineering, Well-collapse Source-injection Mechanisms +13

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Alan D. Tipton, Jonathan A. Pellish, John M. Hutson et al. · IEEE Transactions on Nuclear Science · 2008 · 53 citations

Laser-Induced Current Transients in Silicon-Germanium HBTs

Jonathan A. Pellish, Robert A. Reed, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2008 · 40 citations

Transient Grating, Photonics, Electrical Engineering +14