Jeffrey D. Black

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 394 citations

Low-power Electronics, Hardware Security, Electrical Engineering +14

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2009 · 191 citations

Rate Predictions, Low Energy Protons, Electrical Engineering +14

Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction

Jeffrey D. Black, P.E. Dodd, Kevin M. Warren · IEEE Transactions on Nuclear Science · 2013 · 175 citations

Engineering, Nuclear Physics, Single-event Effects +16

Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies

Balaji Narasimham, B. L. Bhuva, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2007 · 170 citations

Engineering, Vlsi Design, Nuclear Physics +21

Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization

Dolores Black, William H. Robinson, Ian Wilcox et al. · IEEE Transactions on Nuclear Science · 2015 · 137 citations · Full text

Device Modeling, Hardware Security, Electrical Engineering +13