Dolores Black

Modeling of Single Event Transients With Dual Double-Exponential Current Sources: Implications for Logic Cell Characterization

Dolores Black, William H. Robinson, Ian Wilcox et al. · IEEE Transactions on Nuclear Science · 2015 · 137 citations · Full text

Device Modeling, Hardware Security, Electrical Engineering +13

Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing

Heather Quinn, Dolores Black, William H. Robinson et al. · IEEE Transactions on Nuclear Science · 2013 · 88 citations

Emulation Technique, Engineering, Hardware Verification Language +22

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

Jeffrey D. Black, Dennis R. Ball, William H. Robinson et al. · IEEE Transactions on Nuclear Science · 2008 · 82 citations

Hardware Security, Electrical Engineering, Well-collapse Source-injection Mechanisms +13

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 74 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13

C-CREST Technique for Combinational Logic SET Testing

Jonathan R. Ahlbin, Jeffrey D. Black, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2008 · 45 citations

Engineering, Vlsi Design, Nm Cmos +21