Ray Ladbury

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Timothy R. Oldham, Ray Ladbury, M. Friendlich et al. · IEEE Transactions on Nuclear Science · 2006 · 109 citations

Engineering, Computer Engineering, Electrical Engineering +15

Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)

Paul W. Marshall, Martin A. Carts, Steve Currie et al. · IEEE Transactions on Nuclear Science · 2005 · 100 citations

Engineering, Computer Engineering, Electrical Engineering +13

Space Radiation Effects on SiC Power Device Reliability

Jean‐Marie Lauenstein, Megan C. Casey, Ray Ladbury et al. · 2021 · 96 citations

Engineering, Aerospace Engineering, Electrical Engineering +17

Evidence for angular effects in proton-induced single-event upsets

Robert A. Reed, Paul W. Marshall, H.S. Kim et al. · IEEE Transactions on Nuclear Science · 2002 · 71 citations

Engineering, Electrical Engineering, Physics +13

Current single event effects and radiation damage results for candidate spacecraft electronics

Martha V. O'Bryan, Kenneth A. LaBel, Ray Ladbury et al. · 2003 · 58 citations · Full text

Engineering, Aerospace Engineering, Electrical Engineering +17