H.S. Kim

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Timothy R. Oldham, Ray Ladbury, M. Friendlich et al. · IEEE Transactions on Nuclear Science · 2006 · 109 citations

Engineering, Computer Engineering, Electrical Engineering +15

Evidence for angular effects in proton-induced single-event upsets

Robert A. Reed, Paul W. Marshall, H.S. Kim et al. · IEEE Transactions on Nuclear Science · 2002 · 71 citations

Engineering, Electrical Engineering, Physics +13

Current single event effects and radiation damage results for candidate spacecraft electronics

Martha V. O'Bryan, Kenneth A. LaBel, Ray Ladbury et al. · 2003 · 58 citations · Full text

Engineering, Aerospace Engineering, Electrical Engineering +17

Variation in SEU sensitivity of dose-imprinted CMOS SRAMs

E. G. Stassinopoulos, G. J. Brucker, O. Van Gunten et al. · IEEE Transactions on Nuclear Science · 1989 · 48 citations

Medicine, Computer Systems, Memory +16

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

Kenneth A. LaBel, Paul W. Marshall, Cheryl J. Marshall et al. · IEEE Transactions on Nuclear Science · 1997 · 46 citations

Engineering, Nuclear Engineering, Nuclear Physics +13