O. Van Gunten

Variation in SEU sensitivity of dose-imprinted CMOS SRAMs

E. G. Stassinopoulos, G. J. Brucker, O. Van Gunten et al. · IEEE Transactions on Nuclear Science · 1989 · 47 citations

Engineering, Nuclear Physics, Radiation Physics +22

The Damage Equivalence of Electrons, Protons, and Gamma Rays in MOS Devices

G. J. Brucker, E. G. Stassinopoulos, O. Van Gunten et al. · IEEE Transactions on Nuclear Science · 1982 · 41 citations

Engineering, Radiation Effect, Radiation Exposure +19

Recovery of Damage in Rad-Hard MOS Devices during and after Irradiation by Electrons, Protons, Alphas, and Gamma Rays

G. J. Brucker, O. Van Gunten, E. G. Stassinopoulos et al. · IEEE Transactions on Nuclear Science · 1983 · 23 citations

Engineering, Radiation Effect, Radiation Exposure +17

The Damage Equivalence of Electrons, Protons, Alphas and Gamma Rays in Rad-Hard MOS Devices

E. G. Stassinopoulos, O. Van Gunten, G. J. Brucker et al. · IEEE Transactions on Nuclear Science · 1983 · 22 citations

Engineering, Radiation Effect, Radiation Exposure +16

Radiation Effects on MOS Devices: Dosimetry, Annealing, Irradiation Sequence, and Sources

E. G. Stassinopoulos, G. J. Brucker, O. Van Gunten et al. · IEEE Transactions on Nuclear Science · 1983 · 17 citations · Full text

Electrical Engineering, Mos Devices, Engineering +13