Megan C. Casey

Space Radiation Effects on SiC Power Device Reliability

Jean‐Marie Lauenstein, Megan C. Casey, Ray Ladbury et al. · 2021 · 91 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 74 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13

C-CREST Technique for Combinational Logic SET Testing

Jonathan R. Ahlbin, Jeffrey D. Black, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2008 · 45 citations

Engineering, Vlsi Design, Nm Cmos +21

A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

T. D. Loveless, L. W. Massengill, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2008 · 43 citations

Electrical Engineering, Radiation-hardened-by-design Voltage-controlled Oscillator, Engineering +12

Laser Verification of Charge Sharing in a 90 nm Bulk CMOS Process

Oluwole A. Amusan, Megan C. Casey, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2009 · 36 citations

Engineering, Interconnect (Integrated Circuits), Semiconductor Device +16