Jean‐Marie Lauenstein

Single-Event Burnout Mechanisms in SiC Power MOSFETs

Arthur F. Witulski, Dennis R. Ball, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 2018 · 175 citations · Full text

Electrical Engineering, Experimental Data, Engineering +15

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 129 citations

Electrical Engineering, Engineering, Power Device +12

Impact of Ion Energy and Species on Single Event Effects Analysis

Robert A. Reed, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2007 · 117 citations

Rate Predictions, Radiation Events, Health Sciences +15

Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence

Arto Javanainen, K.F. Galloway, Christopher Nicklaw et al. · IEEE Transactions on Nuclear Science · 2016 · 93 citations · Full text

Electrical Engineering, Sic Schottky Diodes, Engineering +14

Space Radiation Effects on SiC Power Device Reliability

Jean‐Marie Lauenstein, Megan C. Casey, Ray Ladbury et al. · 2021 · 91 citations

Reliability, Electrical Engineering, Reliability Engineering +13