Jean‐Marie Lauenstein

Single-Event Burnout Mechanisms in SiC Power MOSFETs

Arthur F. Witulski, Dennis R. Ball, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 2018 · 179 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 133 citations

Engineering, Electrical Engineering, Physics +17

Impact of Ion Energy and Species on Single Event Effects Analysis

Robert A. Reed, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2007 · 118 citations

Medicine, Nuclear Engineering, Physics +13

Space Radiation Effects on SiC Power Device Reliability

Jean‐Marie Lauenstein, Megan C. Casey, Ray Ladbury et al. · 2021 · 96 citations

Engineering, Aerospace Engineering, Electrical Engineering +17

Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence

Arto Javanainen, K.F. Galloway, Christopher Nicklaw et al. · IEEE Transactions on Nuclear Science · 2016 · 94 citations · Full text

Engineering, Electrical Engineering, Materials Science +17