IEEE Transactions on Nuclear Science · 2007 · 118 citations · 26 references
MedicineNuclear EngineeringPhysicsNuclear PhysicsRadiation DosimetryRadiation PhysicsAbsorbed DoseRadiation DetectorsDetector ModelingDetector Response ModelingDirect Nuclear ReactionsFabricationIon-ion InteractionsIrradiation EffectsLet-dependent Response ModelingRadiation Effects
Experimental evidence and Monte-Carlo simulations for several technologies show that accurate SEE response predictions depend on a detailed description of the variability of radiation events (e.g., nuclear reactions), as opposed to the classical single-valued LET parameter. Rate predictions conducted with this simulation framework exhibit excellent agreement with the average observed SEU rate on NASA's MESSENGER mission to Mercury, while a prediction from the traditional IRPP method, which does not include the contribution from ion-ion reactions, falls well below the observed rate. While rate predictions depend on availability of technology information, the approach described here is sufficiently flexible that reasonably accurate results describing the response to irradiation can be obtained even in the absence of detailed information about the device geometry and fabrication process.
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Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 173 citations
Multiple-Bit Upset in 130 nm CMOS Technology
Alan D. Tipton, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2006 · 102 citations
Engineering, Computer Engineering, Electrical Engineering +17