R. Harboe-Sørensen

From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

R. Harboe-Sørensen, C. Poivey, F.-X. Guerre et al. · IEEE Transactions on Nuclear Science · 2008 · 92 citations

Engineering, Nuclear Engineering, Instrumentation +11

Heavy Ion Testing and 3-D Simulations of Multiple Cell Upset in 65 nm Standard SRAMs

D. Giot, Philippe Roché, Gilles Gasiot et al. · IEEE Transactions on Nuclear Science · 2008 · 68 citations

Engineering, Computer Engineering, Electrical Engineering +11

A verified proton induced latch-up in space (CMOS SRAM)

L. Adams, E. Daly, R. Harboe-Sørensen et al. · IEEE Transactions on Nuclear Science · 1992 · 61 citations

Engineering, Computer Engineering, Memory +9

Design, Testing and Calibration of a "Reference SEU Monitor" System

R. Harboe-Sørensen, F.-X. Guerre, A. Roseng · ESA SP · 2005 · 59 citations

Engineering, Computer Engineering, Electrical Engineering +16

Multiple-Bit Upset Analysis in 90 nm SRAMs: Heavy Ions Testing and 3D Simulations

D. Giot, Philippe Roché, Gilles Gasiot et al. · IEEE Transactions on Nuclear Science · 2007 · 59 citations

Engineering, Computer Engineering, Electrical Engineering +13