IEEE Transactions on Nuclear Science · 2008 · 92 citations · 7 references
EngineeringNuclear EngineeringInstrumentationRadiation MeasurementRadiation ProtectionCalibrationEquipment CalibrationRadiation InstrumentationRadiation Monitoring SystemsCalibration CoefficientsCalibration Data AnalysisCalibration SystemsRadiation Monitoring CalibrationRadiation Source Calibration
The reference SEU Monitor system designed and presented in 2005 (R. H. SOslashrensen, F.-X. Guerre, and A. Roseng ldquoDesign, testing and calibration of a reference SEU monitor system,rdquo in <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Proc.</i> <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">RADECS</i> , 2005, pp. B3-1-B3-7) has now been used by many researchers at many radiation test sites and has provided valuable calibration data in support of numerous projects. As some of these findings and results give new insight into improved inter-facility calibrations and provide additional inputs into ongoing SEE research, a few of the more interesting cases are presented. Furthermore the dasiadetector elementpsila, the Atmel AT60142F SRAM, now in a hybrid configuration, will form the key detector element in the Technology Demonstration Module (TDM) to be flown on-board the PROBA-II satellite, to be launched at the beginning of 2009. This flight opportunity extends the Reference SEU Database with both ground and space data, taken on the same device under identical operating conditions. Additionally, the Reference SEU Monitor concept is employed as the basis for the new Reference SEL Monitor system, currently under characterization and preparation for integration on the TDM. Ground SEU/SEL characterization of this latch-up experiment is also presented as well as the basic concept of the TDM, the PROBA-II Radiation Monitor module.
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TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory
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Heavy Ion Energy Effects in CMOS SRAMs
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Engineering, Computer Engineering, Electrical Engineering +16
TID Test of an 8-Gbit NAND Flash Memory
H. Schmidt, Kai Grürmann, B. Nickson et al. · IEEE Transactions on Nuclear Science · 2009 · 29 citations