Publication | Closed Access
TID and SEE Tests of an Advanced 8 Gbit NAND-Flash Memory
49
Citations
12
References
2008
Year
Unknown Venue
Hardware SecurityNon-volatile MemoryElectrical EngineeringEngineeringError PercentageFlash MemoryOperational Mode DependenceComputer EngineeringComputer ArchitectureGbit Nand-flash MemorySemiconductor MemorySee TestsAdvanced 8MicroelectronicsSefi Cross Sections
We report on the dose and operational mode dependence of error percentage, stand-by current, erase and write time of 8 Gbit / 4 Gbit NAND-flash memories as well as on their static, dynamic and SEFI cross sections.
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