Kai Grürmann

Radiation Effects in Flash Memories

Simone Gerardin, Marta Bagatin, A. Paccagnella et al. · IEEE Transactions on Nuclear Science · 2013 · 145 citations

Non-volatile Memory, Electrical Engineering, Engineering +13

TID Test of an 8-Gbit NAND Flash Memory

H. Schmidt, Kai Grürmann, B. Nickson et al. · IEEE Transactions on Nuclear Science · 2009 · 29 citations

Tid Test, Electrical Engineering, New Results +11

Heavy Ion Sensitivity of 16/32-Gbit NAND-Flash and 4-Gbit DDR3 SDRAM

Kai Grürmann, Martin Herrmann, F. Gliem et al. · 2012 · 26 citations

Non-volatile Memory, Electrical Engineering, Engineering +9

In-Situ TID Test of 4-Gbit DDR3 SDRAM Devices

Martin Herrmann, Kai Grürmann, F. Gliem et al. · 2013 · 18 citations

In-situ Tid Test, Total-dose Effects, Engineering +10

SEU and MBU Angular Dependence of Samsung and Micron 8-Gbit SLC NAND-Flash Memories under Heavy-Ion Irradiation

Kai Grürmann, D. Walter, Martin Herrmann et al. · 2011 · 14 citations

Non-volatile Memory, Electrical Engineering, Engineering +13