Andrew L. Sternberg

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 398 citations

Engineering, Computer Engineering, Electrical Engineering +11

Single-Event Burnout Mechanisms in SiC Power MOSFETs

Arthur F. Witulski, Dennis R. Ball, K.F. Galloway et al. · IEEE Transactions on Nuclear Science · 2018 · 179 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 133 citations

Engineering, Electrical Engineering, Physics +17

HBD layout isolation techniques for multiple node charge collection mitigation

Jeffrey D. Black, Andrew L. Sternberg, Michael L. Alles et al. · IEEE Transactions on Nuclear Science · 2005 · 123 citations

Engineering, Computer Engineering, Electrical Engineering +15

Single Event Upsets in Deep-Submicrometer Technologies Due to Charge Sharing

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 109 citations

Engineering, Electrical Engineering, Fault-tolerant Computing +7