The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall, +12

IEEE Transactions on Nuclear Science

Charge DepositionIon ImplantationEngineeringNuclear PhysicsPhysics +13

Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design

Brian D. Olson, Dennis R. Ball, Kevin M. Warren, +4

IEEE Transactions on Nuclear Science

Electrical EngineeringEngineeringVlsi DesignPhysicsNanoelectronics +12

Analysis of Parasitic PNP Bipolar Transistor Mitigation Using Well Contacts in 130 nm and 90 nm CMOS Technology

Brian D. Olson, Oluwole A. Amusan, Sandeepan DasGupta, +6

IEEE Transactions on Nuclear Science

Device ModelingMixed- Mode SimulationsElectrical EngineeringEngineeringNanoelectronics +11

Comparison of various transport media on human periodontal ligament cell viability

Brian D. Olson, Jason M. Mailhot, Ronald W. Anderson, +2

Journal of Endodontics

MechanobiologyTissue EngineeringEngineeringBiomechanicsPhysiology +9

Demonstration of a Differential Layout Solution for Improved ASET Tolerance in CMOS A/MS Circuits

Sarah E. Armstrong, Brian D. Olson, W.T. Holman, +3

IEEE Transactions on Nuclear Science

Electrical EngineeringPhysical Design (Electronics)EngineeringVlsi DesignCircuit System +11

Leakage Current Degradation of Gallium Nitride Transistors Due to Heavy Ion Tests

Brian D. Olson, J. David Ingalls, Casey H. Rice, +4

Wide-bandgap SemiconductorSemiconductor TechnologyElectrical EngineeringEngineeringStress-induced Leakage Current +11

Design Technique for Mitigation of Soft Errors in Differential Switched-Capacitor Circuits

Patrick R. Fleming, Brian D. Olson, W.T. Holman, +2

IEEE Transactions on Circuits & Systems II Express Briefs

Switched-capacitor Differential CircuitsEngineeringDesign TechniqueAnalog DesignCircuit System +14

Analysis of Single-Event Transients in Integer-$N$ Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops

Thomas Daniel Loveles, Brian D. Olson, B. L. Bhuva, +3

IEEE Transactions on Nuclear Science

Electrical EngineeringEngineeringHigh-frequency DeviceTiming AnalysisClock Recovery +7

Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs

Brian D. Olson, W.T. Holman, L. W. Massengill, +2

IEEE Transactions on Nuclear Science

Electrical EngineeringEngineeringNuclear PhysicsRadiation-hard DesignRadiation Detection +13

RHBD Bias Circuits Utilizing Sensitive Node Active Charge Cancellation

Raymond W. Blaine, Sarah E. Armstrong, J. S. Kauppila, +4

IEEE Transactions on Nuclear Science

Low-power ElectronicsElectrical EngineeringEngineeringVlsi DesignBias Circuit +10