J. David Ingalls

Leakage Current Degradation of Gallium Nitride Transistors Due to Heavy Ion Tests

Brian D. Olson, J. David Ingalls, Casey H. Rice et al. · 2015 · 32 citations · Full text

Wide-bandgap Semiconductor, Semiconductor Technology, Electrical Engineering +13

Impact of X-Ray Exposure on a Triple-Level-Cell NAND Flash

Matthew J. Gadlage, Matthew Kay, J. David Ingalls et al. · IEEE Transactions on Nuclear Science · 2013 · 18 citations

Engineering, Microscopy, Radiation Exposure +19

Directional Dependence of Co-60 Irradiation on the Total Dose Response of Flash Memories

Matthew J. Gadlage, David I. Bruce, J. David Ingalls et al. · IEEE Transactions on Nuclear Science · 2018 · 13 citations

Non-volatile Memory, Engineering, Radiation Effect +16

Total Dose and Heavy Ion Radiation Response of 55 nm Avalanche Technology Spin Transfer Torque MRAM

J. David Ingalls, Matthew J. Gadlage, Jonathan Wang et al. · 2019 · 13 citations

Magnetism, Spintronics, Electrical Engineering +15

Single Event Effects in 14-Nm Intel Microprocessors

Adam R. Duncan, Carl M. Szabo, Dobrin P. Bossev et al. · 2016 · 12 citations