Adam R. Duncan

Soft Errors Induced by High-Energy Electrons

Matthew J. Gadlage, A. Roach, Adam R. Duncan et al. · IEEE Transactions on Device and Materials Reliability · 2016 · 74 citations

Engineering, Nuclear Physics, Computer Architecture +19

Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage

Matthew J. Gadlage, A. Roach, Adam R. Duncan et al. · IEEE Transactions on Nuclear Science · 2015 · 42 citations

Electron-induced Single-event Upsets, Electron-induced Seus, Electrical Engineering +15

FPGA Bitstream Security: A Day in the Life

Adam R. Duncan, Fahim Rahman, Andrew Lukefahr et al. · 2019 · 40 citations

Engineering, Hardware Verification Language, Information Security +16

Single-event mitigation in combinational logic using targeted data path hardening

V. Srinivasan, Andrew L. Sternberg, Adam R. Duncan et al. · IEEE Transactions on Nuclear Science · 2005 · 38 citations

Hardware Trojan, Engineering, Verification +24

Leakage Current Degradation of Gallium Nitride Transistors Due to Heavy Ion Tests

Brian D. Olson, J. David Ingalls, Casey H. Rice et al. · 2015 · 32 citations · Full text

Wide-bandgap Semiconductor, Semiconductor Technology, Electrical Engineering +13