David F. Heidel

Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

Kenneth P. Rodbell, David F. Heidel, Henry H. K. Tang et al. · IEEE Transactions on Nuclear Science · 2007 · 186 citations

Natural Sciences, Electrical Engineering, Physics +14

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2009 · 163 citations

Engineering, Computer Engineering, Electrical Engineering +8

An Overview of the BlueGene/L Supercomputer

N. R. Adiga, George Almási, George Almási et al. · 2002 · 160 citations

Engineering, Computer Science, High-performance Computing +17

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Kenneth A. LaBel et al. · IEEE Transactions on Nuclear Science · 2008 · 157 citations

Engineering, Computer Engineering, Electrical Engineering +15

Asynchronous interlocked pipelined CMOS circuits operating at 3.3-4.5 GHz

S.E. Schuster, W. Reohr, Peter W. Cook et al. · 2002 · 70 citations

Engineering, Computer Engineering, Electrical Engineering +17