Kenneth P. Rodbell

Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground

Michael S. Gordon, P. Goldhagen, Kenneth P. Rodbell et al. · IEEE Transactions on Nuclear Science · 2004 · 375 citations

Magnetar, Engineering, Nuclear Physics +13

Mechanisms for microstructure evolution in electroplated copper thin films near room temperature

J. M. E. Harper, C. Cabral, P. C. Andricacos et al. · Journal of Applied Physics · 1999 · 354 citations

Engineering, Severe Plastic Deformation, Thin Film Process Technology +16

Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

Kenneth P. Rodbell, David F. Heidel, Henry H. K. Tang et al. · IEEE Transactions on Nuclear Science · 2007 · 183 citations

Engineering, Ion Beam Instrumentation, Proton Irradiation +16

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2009 · 162 citations

Hardware Security, Electrical Engineering, Engineering +15

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

David F. Heidel, Paul W. Marshall, Kenneth A. LaBel et al. · IEEE Transactions on Nuclear Science · 2008 · 156 citations

Hardware Security, Experimental Results, Electrical Engineering +14