Michael S. Gordon

Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground

Michael S. Gordon, P. Goldhagen, Kenneth P. Rodbell et al. · IEEE Transactions on Nuclear Science · 2004 · 375 citations

Magnetar, Engineering, Nuclear Physics +13

Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

Kenneth P. Rodbell, David F. Heidel, Henry H. K. Tang et al. · IEEE Transactions on Nuclear Science · 2007 · 183 citations

Engineering, Ion Beam Instrumentation, Proton Irradiation +16

SRAM SER in 90, 130 and 180 nm bulk and SOI technologies

Ethan H. Cannon, D.D. Reinhardt, Michael S. Gordon et al. · 2004 · 103 citations

Engineering, Vlsi Design, Sram Ser +18

A Thin-Film SOI 180nm CMOS RF Switch Technology

A. Botula, Alvin Joseph, J. Slinkman et al. · 2009 · 84 citations

Low-power Electronics, Electrical Engineering, Rf Switch Applications +12

32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches

Kenneth P. Rodbell, David F. Heidel, Jonathan A. Pellish et al. · IEEE Transactions on Nuclear Science · 2011 · 59 citations

Single Event Upset, Seu Predictions, Vlsi Design +16