Publication | Closed Access
Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
74
Citations
9
References
1997
Year
Bias ConditionsElectrical EngineeringSingle Event UpsetEngineeringSensitivity DependenceCircuit DesignSeu ControlCircuit SystemMixed-signal Integrated CircuitBias Temperature InstabilityComputer EngineeringSingle Event EffectsCircuit ReliabilityElectrophysiologyIntegrated CircuitsInstrumentationMicroelectronicsUpset Mechanism
The single event upset (SEU) sensitivity of certain types of linear microcircuits is strongly affected by bias conditions. For these devices, a model of upset mechanism and a method for SEU control have been suggested.
| Year | Citations | |
|---|---|---|
Page 1
Page 1